Boundary Scan Test Application

Providing the appropriate technology we offer the access to your application!

You are dealing with the test of modern electronics all the time − in the lab, in the production or directly when working with a board.

Modern PCBs provide more and more functionality on less and less space. Your PCBs are equipped with a lot of components whose pins are increasingly harder or even non-accessible by In-Circuit Tester nails.

Access is the central problem for all test processes – the access to the Unit Under Test (UUT) to execute a required application.

Utilising Embedded System Access technologies (ESA) provides the chance to use standardized instrumentation platforms based on JTAG/Boundary Scan throughout the entire product life cycle, reusing existing applications and increasing the fault coverage in the production test.