Skip to main content

Embedded Board Test

Embedded Board Test describes a test method for modern electronics, using the intelligence of built-in circuits. Various technologies are used, having one thing in common: both generation and application of the test scenarios takes place in one system. The test system consists of a unique, modular control hardware and software.

Embedded Board Test allows digital, static test of pins and networks. Functional tests can also be integrated. These include access to I2C and SPI components, measurement and evaluation of analog processor inputs, dynamic memory tests and test of high-speed interfaces (e.g. USB 3.0.).

Typical production faults such as short circuits, missing resistors, non-soldered pins and BGA balls, but also errors in high-speed data transmission are can be found quickly and efficiently. The short execution time and accurate fault diagnosis allow cost-optimized repair.

Steffen Kamprad - Sales Manager
Steffen Kamprad
+49-3641-6896-714 Phone

A total of four combinable technologies form the pillars of the Embedded Board Test.

The standardized method simply addresses complex components such as FPGAs, processors, controllers and CPLDs. Detailed hardware knowledge is not required.

» Find our more about Boundary Scan

FPGA based tests (ChipVORX)

This method integrates the FPGA logic into the test. Even complex test applications are easy and efficient to solve with ChipVORX. Access to internal Gigabit links and other functionalities (frequency measurement, flash access, RAM tests) is possible via universal FPGA models (no separate adaption necessary).

» Find out more about ChipVORX

VarioTAP

A processor-specific model allows the processor to enter the debug mode. With VarioTAP individual functions (analog registers, flash access, real-time RAM tests) are addressed. Both the JTAG port and other debug interfaces are supported.

» Find out more about VarioTAP

Processor-based tests with a universal (JEDOS)

Using JEDOS (optimized for test and programming applications), complex function tests with a graphical user interface are realized. These are complete memory tests, efficient flash access or interfaces tests (Ethernet, USB …). The tests can be created in the shortest possible time without special hardware knowledge.

» Learn more about JEDOS