Highly Accelerated Stress Screening
Highly Accelerated Stress Screening is a quality control method using continuous functional tests on the manufactured devices. A defined number of units is taken from the production lot and fed into the screening test facility. For achieving high fault detection, the control devices are subjected to temperature cycles between the lowest and highest limit of the operating temperature during the test.
Using simple statistic methods, it can be inferred from the number of failures that occur within the screened batch, the failure rate of the whole batch. Conversely the number of control devices that should be put through the screening test results from the definition of a maximum failure rate.
The test methods used in the screening test correspond physically to the Run-In-Test. Hence, the test facilities used are identical.
- Parallel test
- TRUE/FALSE evaluation
- Duration of process and product optimisation to the point of stable delivery is reduced up to one third or a half
- Unlimited success in regard to the minimised failure rate of delivered control devices and the technological knowledge for the optimisation of the production process and increase of the product quality